Contributing widely from construction materials to modules
Photovoltaic cells are a clean, inexhaustible energy source, and active R&D is being conducted to achieve goals such as boosting performance and lengthening service life. For the silicon-based types, which account for about 90% of photovoltaics currently in practical use, we contribute in areas like improving generation/conversion efficiency and stabilizing quality by providing various types of evaluation for the silicon which is the cell material, as well as the electrodes, glass, process gases, and other process elements.
Test Items
| object of analysis | test items | techniques/apparatus | |
|---|---|---|---|
| Crystal type | Ingot | Impurities | ICP-MS、GD-MS |
| Cell | Surface impurities | ICP-MS、IC、CE、TD-GC-MS、TOF-SIMS | |
| Impurities at specified depth | ICP-MS | ||
| Impurity depth distribution | SIMS | ||
| Surface form | SEM、AFM | ||
| Crystallinity, defects | Cathodoluminescence、ESR | ||
| Anti-reflection film | Impurities | SIMS、TDS、ICP-MS | |
| Film structure | XPS、RBS | ||
| Ag paste | Particle size | Particle size distribution | |
| Impurities | ICP-MS | ||
| Contact with cell | SEM、TEM | ||
| Volatile components | GC-MS | ||
| Thin-film type | Cell | Surface impurities | ICP-MS、IC、CE、TD-GC-MS、TOF-SIMS |
| Impurities in film | SIMS、TDS、ICP-MS | ||
| Film structure | TEM-EDX、SIMS、XPS、AES | ||
| Surface form | SEM、AFM | ||
| Crystallinity | Raman spectroscopy、TEM、XRD | ||
| Glass substrate | Impurities | ICP-MS、TOF-SIMS | |
| Surface status | XPS | ||
| Transparent conductive film | Impurities | SIMS、TDS | |
| Film structure | XPS、RBS | ||
| Surface form | SEM、AFM | ||
| Crystallinity | Raman spectroscopy、TEM、XRD | ||
| Module constituent substances | Encapsulant (EVA, etc.) |
Deterioration | FT-IR、GC-MS、Chemiluminescence |
| Back sheet | Barrier performance | Gas permeability | |
| Permeated gas components | API-MS | ||
| Film composition | FT-IR | ||
| Adhesive composition | FT-IR、GC-MS | ||
| Panels | Service life | Environment-resistance test | Weather resistance test, constant temperature and humidity test |
| Component parts | Environmentally hazardous substances(RoHS, REACH) | ICP-AES、GC-MS、IC | |
| Manufacturing environment | Cleanroom | Impurities in the environment | ICP-MS、IC、CE、GC-MS |
Technical News
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TN349UV-Py-GC/MS Evaluation of Deterioration in Polymers due to UV, Oxidation and Heat
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TN348Determination of Metallic Impurities in Silicon Solar Cell
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TN347Determination of Trace Impurities on Silicon Surface in Solar Cell
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TN346Evaluation of Degradation of Polymer Encapsulants in Photovoltaic Cell
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TN345Evaluation of thin film silicon solar cell
Contact Us for Services
For inquiries and requests concerning services of analysis, measurements, products and consulting , please feel free to contact us via inquiry form or telephone/fax .
- Telephone
- +81-3-5689-1219
- FAX
- +81-3-5689-1222