Film quality evaluation of organic thin film
Multi-layer thin films are used in organic devices. This means that the structure or state of the thin film could change the characteristics of the device. The characteristics of the film (such as its crystallinity or orientation) could have a particularly significant effect on carrier transport properties, so selecting an analysis method to suit the state of the sample and your evaluation objectives is important when analyzing these thin film structures.
Test Items
We select the ideal measurement method based on the escape depth and area of analysis, according to the goals of the evaluation. This is especially true when evaluating crystallinity and orientation, where it is necessary to select the optimal method based on the state of the sample and the resolution of measurement.
| TEM | AFM | Elipsometry | Polarized ATR | Raman spectroscopy | XRD | XRR | XAS | ESR | |
|---|---|---|---|---|---|---|---|---|---|
| Crystallinity | ○ | △ Surfece |
－ | － | ○ | ◎ | － | － | － |
| Orientation | △ | － | △ | ○ | ○ | ○ | － | ○ | ○ |
| Film thickness | ◎ | △ Step |
○ | － | － | － | － | － | － |
| Density | － | － | － | － | － | － | ○ | － | － |
| Surface roughness | △ | ◎ | △ | － | － | － | － | － | － |
| Interfaces | ○ | － | － | － | － | － | － | － | ○ |
| Mapping | ○ | ○ | ○ | ○ | － | － | － | － | － |
| Multilayer film | ◎ | － | ○ | ◎ | ○ | － | － | － | ○ |
- TEM transmission electron microscopy
- ATR attenuated total reflection infra-red spectroscopy
- XRR X-ray reflectivity
- ESR electron spin resonance spectroscopy
- AFM atomic force mictroscopy
- XRD X-ray diffraction spectroscopy
- XAS X-ray absorption spectroscpy
Technical News
-
TN462NEWValence Evaluation of Doped Metal Elements in Glass by ESR
-
TN492Estimation of Molecular Orientation in Organic Thin Films by XAS
-
TN485Visualization of Components and Structure in the Micro Region: Imaging Analysis by Raman Microspectroscopy
-
TN484Precision Measurement of Coefficient of Thermal Expansion (CTE) by High Sensitivity TMA
-
TN463Evaluation of polymer materials by ESR method
-
TN452Crystalline Evaluation of Organic Semiconductors by TEM using Cryo-FIB Method
-
TN442Evaluation of Functional Groups on Polymeric Material Surface by X-ray Photoelectron Spectroscopy (XPS)
-
TN403Electron Microscope Observations of Bulk-Hetero Junction Organic Solar Cells
Related Informations
Contact Us for Services
For inquiries and requests concerning services of analysis, measurements, products and consulting , please feel free to contact us via inquiry form or telephone/fax .
- Telephone
- +81-3-5689-1219
- FAX
- +81-3-5689-1222