Contributing widely from construction materials to modules
Photovoltaic cells are a clean, inexhaustible energy source, and active R&D is being conducted to achieve goals such as boosting performance and lengthening service life. Regarding the next-generation of photovoltaics, such as Perovskite and organic thin-film types, which can be fabricated at lower cost than the current mainstream silicon type, we support R&D to achieve further improvement in generation/conversion efficiency, through approaches such as evaluation of various materials and observation of cell structure.
Test Items
| object of analysis | test items | techniques/apparatus | |
|---|---|---|---|
| Next-generation types (organic types, etc.) | Cell structure analysis | Layer interface, film thickness | FIB-SEM,STEM |
| Element composition | SEM-EDS,STEM-EDS | ||
| Element dispersion | Backside-SIMS | ||
| Crystallinity | SAXS,WAXS | ||
| Orientation | XAS,ESR,STEM | ||
| Defect analysis | STEM,Raman spectroscopy | ||
| Cell component analysis | Determination of organic components | MALDI-TOF/MS | |
| Precision structure analysis | LC-FT/MSn,NMR | ||
| Analysis of impurities | LC-FT/MSn | ||
| Analysis of deterioration | MALDI-TOF/MS | ||
| Analysis of position information | GCIB-TOF-SIMS | ||
| Compound types | Cell | Surface impurities | ICP-MS、IC、CE、TD-GC-MS、TOF-SIMS |
| Impurities | SIMS | ||
| Film structure | TEM-EDX、SIMS、XPS、AES | ||
| Crystallinity | Raman spectroscopy、TEM、Cathodoluminescence | ||
| Module constituent substances | Encapsulant (EVA, etc.) |
Deterioration | FT-IR、GC-MS、Chemiluminescence |
| Back sheet | Barrier performance | Gas permeability | |
| Permeated gas components | API-MS | ||
| Film composition | FT-IR | ||
| Adhesive composition | FT-IR、GC-MS | ||
| Panels | Service life | Environment-resistance testing | Weather resistance test, constant temperature and humidity test |
| Component parts | Environmentally hazardous substances (RoHS, REACH) |
ICP-AES、GC-MS、IC | |
| Manufacturing environment | Cleanroom | Impurities in the environment | ICP-MS、IC、CE、GC-MS |
Technical News
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TN462NEWValence Evaluation of Doped Metal Elements in Glass by ESR
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TN492Estimation of Molecular Orientation in Organic Thin Films by XAS
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TN485Visualization of Components and Structure in the Micro Region: Imaging Analysis by Raman Microspectroscopy
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TN484Precision Measurement of Coefficient of Thermal Expansion (CTE) by High Sensitivity TMA
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TN463Evaluation of polymer materials by ESR method
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TN452Crystalline Evaluation of Organic Semiconductors by TEM using Cryo-FIB Method
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TN442Evaluation of Functional Groups on Polymeric Material Surface by X-ray Photoelectron Spectroscopy (XPS)
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TN409Evaluation of Layered Structure of Organic Semiconductors by Electron Microscope
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TN403Electron Microscope Observations of Bulk-Hetero Junction Organic Solar Cells
Related Informations
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