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  5. Semiconductor Devices

Semiconductor Devices

When developing cutting-edge materials, the structure and composition must be controlled at the atomic level. Sumika Chemical Analysis Service therefore uses cutting-edge transmission electron microscopes and develops unique pre-processing technologies—focusing on three keywords: ultra-fine, ultra-small, and ultra-thin. We provide a range of analysis methods to suit your needs, such as ultra high sensitivity quantification of metallic contamination on wafer surfaces, surface molecular contaminants (SMC), or device parts (piping, ceramic, or quartz).

Our Services

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For inquiries and requests concerning services of analysis, measurements, products and consulting , please feel free to contact us via inquiry form or telephone/fax .