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Industrial Materials / Products

Title No.
Evaluation of Thermal Runaway Reaction Hazard by ARC NEW TN443
Measurement of Pore Size Distribution by Mercury Porosimetry NEW TN133
Measurement of Particle Size Distribution [Electrical Resistance by Coulter Counter] NEW TN130
Valence Evaluation of Doped Metal Elements in Glass by ESR NEW TN462
High Accuracy CHN Elemental Analysis NEW TN101
Low Bleed HPLC Column “SUMIPAX ODS Z-CLUE” TN375
Separation of Chiral Amine Compounds using Crown Ether Column TN260
Measurement of Particle Density by Gas Replacement Method TN164
Observation of Tissue Structure in Frozen Samples by Synchrotron Radiation X-ray CT TN496
Introduction of Laser Induced Breakdown Spectroscopy (LIBS) TN517
Selection Method of Chiral Stationary Phases TN507E
Comprehensive Thermophysical Analysis of Conductive Pastes TN516
Structural Analysis of Mixed Organic Compounds Using Kendrick Mass Defect Plot TN514
Thermal Shock Test TN317
Analysis of Gas Generated from Combustion or Heated Material TN509
Particle Shape Characterization by Image Analysis TN511
Measurement of Particle Size Distribution [Image Analysis] TN510
Practical Use of Enantiomeric Chiral Stationary Phases which can Reverse the Elution Order of Enantiomers TN259E
Characterization of Chiral Stationary Phases Chemically Bonded with β-Cyclodextrin via Improved Spacer TN256E
Selection Method of Chiral Stationary Phases TN507
Characterization of Polymers with Differential Scanning Calorimetry (DSC) TN505
Structural Analysis with Small Angle X-ray Scattering TN502
Measurement of Specific Surface Area and Pore Size Distribution by Nitrogen Adsorption Method TN132
Molding and Evaluation of Physical Properties of Thermoplastic Resin TN501
True Density Measurement with Gas Adsorption Measuring Device TN498
High Sensitivity and Selectivity Determination of Cosmetic Ingredients by LC-MS/MS TN500
Cross-Sectional SEM Observation of Rubber Containing Inorganic Particles Using Temperature Controlled Cryo-Ar Ion Milling Method TN432
Separation and Structural Analysis of Organic Compounds TN488
Determination of Inorganic Impurities in Graphite TN027E
Determination of Ultratrace Impurities using Inductively Coupled Plasma Mass Spectrometry (ICP-MS) TN051
Visualization of Components and Structure in the Micro Region: Imaging Analysis by Raman Microspectroscopy TN485
Precision Measurement of Coefficient of Thermal Expansion (CTE) by High Sensitivity TMA TN484
Determination of Trace Nitrogen by Oxidative Combustion and Chemiluminescence TN482
Determination of Carbon and Sulfur Content in Solid and Powder Sample
- Infrared Absorption Method after Combustion -
Determination of Metallic Elements by Inductively Coupled Plasma Atomic Emission
Spectrometry (ICP-AES)
Liquefied Petroleum Gas (LPG) Analysis TN479
Techniques for Qualitative Analysis of Trace Level Unknown Compounds by LC-FTMS TN478
Composition Analysis of Lubricating Oil TN477
Evaluation technology for automotive fuel, oil and deposits TN475
Evaluation of Acid Sites in Cu Ion Exchanged Zeolites TN474
Evaluation of polymer materials by ESR method TN463
Characterization of Catalysts by Temperature Programmed Reaction Method TN461
Evaluation of Surface Modification of Solid Samples by X-ray Photoelectron Spectroscopy (XPS) TN458
Crystal Structural Analysis by X-ray Diffraction in Controlled Atmosphere TN457
Analysis of Differential adsorption heat using adsorption curve TN456
Top Surface Observation of Fine Particles by High-resolution Low-voltage SEM TN454
Crystalline Evaluation of Organic Semiconductors by TEM using Cryo-FIB Method TN452
Evaluation of Thermal Reactivity by TG-DTA Measurement in Particular Gas TN446
Identification of Surfactants TN445
Risk assessment of Flammable Powder TN444
Evaluation of Functional Groups on Polymeric Material Surface by X-ray Photoelectron Spectroscopy (XPS) TN442
High Resolution SEM Observation of Surface and Inside of Pt Catalysts TN434
High Resolution Mass Analysis with MALDI-SpiralTOF/MS TN431
Evaluation of Adsorption / Desorption Properties of NO and SO3 TN427
Identification of Foreign Matter by Pyrolysis-GC/MS TN426
Observation of the Coated Paper prepared using Cross Section by FE-SEM TN419
Minimum Ignition Energy Measurement of Combustible Dusts by MIKE4 TN412
Dust Explosion Tests of High Pharmacological Active Substances TN411
Wide Area Mapping of Glass Surface by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN407
Qualitative Analysis of Fluorinated Surface Modifiers by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN406
Qualitative Analysis of Watermarks by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN405
Determination of Thermal Conductivity of Automotive Exhaust Catalysts TN404
Determination of Perfluorinated Compounds (PFCs)-PFCAs、PFASs TN399
Measurement of particle size distribution [Dry sieving] TN379
Characterization of epoxy resin by pulsed NMR TN378
Thermogravimetry - Mass Spectrometry TN374
Evaluation of thermal stability by isoperibolic calorimeter "RADEX" TN366
Determination of Hydrogen in Zinc Coated Steel Using Thermal Desorption Spectroscopy TN358
Evaluation of moisture sorption property TN344
Measurement Method of Volatile Organic Compounds (VOC) Diffused from Automotive Parts TN342
Separated determination of chemical and physical adsorption by difference adsorption isotherm TN338
Identification of foreign substances in drugs TN329
Identification of foreign substances in drugs TN328
Evaluation of the oxidative degradation for polymer materials by the measurement of chemiluminescence TN324
Evaluation of the oxidative degradation for organic compounds by the measurement of chemiluminescence TN323
Solid-state 30Si NMR characterization of silica TN319
Measurement of cavity rate and filler content rate by X-RAY CT SYSTEM TN318
Materials Evaluation by Use of the Electron Microscope with Cs-corrector TN304
Enantiomer Separation of Pyrethroids by HPLC using SUMICHIRAL OA Series TN268
Separation of Fluorous-tag Compounds using SUMICHIRAL OA-7001 Series TN263
Performance and Use of SUMIPAX Filter TN262
Practical Use of Enantiomeric Chiral Stationary Phases which can Invert Elution Order TN259
Determination of D-amino Acids using Improved Pirkle-type Chiral Stationary Phases TN257
Characterization of Chiral Stationary Phases Chemically Bonded with β-Cyclodextrin via Improved Spacer TN256
Comparative Studies of Several Ligand Exchange Chiral Stationary Phases for HPLC ( Part 2 : Aspartic Acid ) TN255
Chemical state analysis in micro area by EPMA TN253
Evaluation of a surface characteristic by a steam absorption isothermal line TN249
Carbon analysis of a small quantity in the steel by EPMA TN245
Water Vapor Permeability Test of packaging foils and films TN243
Catalyst characterization using in-situ FT-IR spectroscopy TN185
Electron Probe MicroAnalysis(EPMA)Scanning Electron Microscopy(SEM) TN174
Electron Probe MicroAnalysis(EPMA)X-Ray Diffraction(XRD) TN173
Field Desorption Mass Spectrometry(FD-MS) TN169
Cross-Section Analysis of Multi-Paint Layers by TOF-SIMS TN166
Measurement of particle size distribution [Laser diffraction/Optical scattering] TN161
Cross section analysis of a silica particle by Time of Flight Secondary Ion Mass Spectrometry TN153
The Additive Analysis of Clear Plastic Wrap Surface by TOF-SIMS TN152
Analysis of fish-eye in PVC film by TOF-SIMS TN151
Measurement of surface and interface tension by pendant drop method TN142
Measurement of Contact Angle by Video Image Processing Method TN141
Measurement of density by oscillational density meter TN139
Evaluation of Metal Surface Area of Catalysts by Pulse Chemisorption TN135
Numerical Evaluation for Powder Characteristics TN134
Analysis of Macro-Molecular Materials Using Double Shot Pylolyzer TN100
Structure Analysis of Polyurethane Type Adhesive TN099
Analysis of Additives in Polymers TN098
Determination of Trace Sulfur and Halogen in Organic Compounds TN093
Structure Analysis of Dyes and Pigments TN081
Composition Analysis of Printing Ink TN069
Polymer Characterization and Additive Analysis TN068
Analysis of Inorganic Impurities in Chemicals for Semiconductor Manufacturing TN066
Glow Discharge Mass Spectrometry TN061
Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN060
Determination of impurities in fine ceramics TN049
The Structure Analysis with Attenuated Total Reflection Method(ATR)of Fourier Transform Infrared Spectroscopy(FT-IR) TN022
The Surface Structure Analysis with Reflection Method of Fourier Transform Infrared Spectroscopy(FT-IR) TN020

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