Structural Analysis｜Applications Classified by Techniques｜Technical Informations

The applications in this goup are useful for determing structure of new chemical substances, materials, impurities, and reaction products generated from every field of industry as well as metabolites in pharmaceutical field.

Nuclear Magnetic Resonance Spectrometer (NMR), Organic Mass Spectrometer (MS), Time-of-Flight Mass Spectrometer (TOF-MS), Ultraviolet-Visible Spectrophotometer (UV-VIS), Fourier Transform Infrared Spectrometer (FT-IR）、Fourier Transform Infrared Microscope (μ-FT-IR), Scanning　Infrared Microprobe System (IRμS/SIRM), Laser Raman Scattering Spectrometer (RSS), Electron Spin Resonance Spectrometer (ESR）, X-Ray Diffractometer (XRD), X-ray Absorption Fine Structure Analyzer (XAFS), etc.

Title	No.
XAFS Measurement of Molten Glass Using the Heating Cell	TN495
Estimation of Molecular Orientation in Organic Thin Films by XAS	TN492
In situ XRD for Lithium Ion Batteries with Controlling Temperature	TN491
Structural Analysis of Mixed Organic Compounds Using Kendrick Mass Defect Plot	TN514
Structure analysis of liquid crystal compounds	TN070
Structural Analysis with Small Angle X-ray Scattering	TN502
Comprehensive Analysis of Fuel Components and Trace Analysis of Sulfur Compounds	TN503
Cross-Sectional SEM Observation of Rubber Containing Inorganic Particles Using Temperature Controlled Cryo-Ar Ion Milling Method	TN432
Separation and Structural Analysis of Organic Compounds	TN488
Visualization of Components and Structure in the Micro Region: Imaging Analysis by Raman Microspectroscopy	TN485
Techniques for Qualitative Analysis of Trace Level Unknown Compounds by LC-FTMS	TN478
Composition Analysis of Lubricating Oil	TN477
Evaluation technology for automotive fuel, oil and deposits	TN475
Crystal Structural Analysis by X-ray Diffraction in Controlled Atmosphere	TN457
Identification of Surfactants	TN445
High Resolution Mass Analysis with MALDI-SpiralTOF/MS	TN431
Electron Microscope Observations of Bulk-Hetero Junction Organic Solar Cells	TN403
Inner observation and chemical mapping of tablet by X-ray CT and TOF-SIMS	TN369
Specification Tests for Biologics using Amino Acid Analysis	TN365
Evaluation of Degradation of Polymer Encapsulants in Photovoltaic Cell	TN346
Identification of foreign substances in drugs	TN329
Solid-state 30Si NMR characterization of silica	TN319
Measurement of cavity rate and filler content rate by X-RAY CT SYSTEM	TN318
Analysis of Deterioration of Hydrocarbon Polymer Electrolyte Film	TN311
Cristallization analysis of the cathode material for Li-ion batteries by XRD	TN295
Nondestructive observation of Li-ion batteries by X-ray CT	TN292
Catalyst characterization using in-situ FT-IR spectroscopy	TN185
Electron Probe MicroAnalysis（EPMA）Scanning Electron Microscopy（SEM）	TN174
Electron Probe MicroAnalysis（EPMA）X-Ray Diffraction（XRD）	TN173
Field Desorption Mass Spectrometry（FD-MS）	TN169
Analysis of fish-eye in PVC film by TOF-SIMS	TN151
Analysis of Macro-Molecular Materials Using Double Shot Pylolyzer	TN100
Structure Analysis of Polyurethane Type Adhesive	TN099
Analysis of Additives in Polymers	TN098
Characterization of Polymorphism	TN097
Structure Determination of Medicine（Regioisomers）	TN090
Structure Analysis of Dyes and Pigments	TN081
Diagnosis for LCD Unevenness －Determination of Foreign Particle Using Micromanipulator－	TN075
Composition Analysis of Printing Ink	TN069
Polymer Characterization and Additive Analysis	TN068
Fourier Transform NMR Method －Two Dimensional NMR－	TN057
Oxide Thickness Determination by X-ray Photoelectron Spectroscopy　(XPS)	TN033
The Structure Analysis with Attenuated Total Reflection Method（ATR）of Fourier Transform Infrared Spectroscopy（FT-IR）	TN022
The Surface Structure Analysis with Reflection Method of Fourier Transform Infrared Spectroscopy（FT-IR）	TN020
Structure Determination of Natural Compound	TN017

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