This group of application is to analyze surficial and interfacial state of electric materials, metals, ceramics, catalysts, and other substances. Also, it is useful to identify alien substances contained in the surface or interface of substances.
Secondary Ion Mass Spectrometer (SIMS), Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS), X-Ray Photoelectron Spectrometer (XPS or ESCA), Scanning Auger Electron Spectroscopy (AES or SAM), Electron Probe Micro Analyzer (EPMA or XMA), Field Emission Scanning Electron Microscope X-Ray Spectroscopy (FE-SEM-EDX), Thermal Desorption Gas Chromatograph-Mass Spectrometer (TDS), Low Arpha-Ray Spectrometer, etc.
Contact Us for Services
For inquiries and requests concerning services of analysis, measurements, products and consulting, please contact us via inquiry form.