Industrial Materials / Products｜Solutions Classified by Objectives｜Technical Informations

Title	No.
Evaluation of Thermal Runaway Reaction Hazard by ARC	NEW TN443
Measurement of Pore Size Distribution by Mercury Porosimetry	NEW TN133
Measurement of Particle Size Distribution [Electrical Resistance by Coulter Counter]	NEW TN130
Valence Evaluation of Doped Metal Elements in Glass by ESR	NEW TN462
High Accuracy CHN Elemental Analysis	NEW TN101
Low Bleed HPLC Column “SUMIPAX ODS Z-CLUE”	TN375
Separation of Chiral Amine Compounds using Crown Ether Column	TN260
Measurement of Particle Density by Gas Replacement Method	TN164
Observation of Tissue Structure in Frozen Samples by Synchrotron Radiation X-ray CT	TN496
Introduction of Laser Induced Breakdown Spectroscopy (LIBS)	TN517
Selection Method of Chiral Stationary Phases	TN507E
Comprehensive Thermophysical Analysis of Conductive Pastes	TN516
Structural Analysis of Mixed Organic Compounds Using Kendrick Mass Defect Plot	TN514
Thermal Shock Test	TN317
Analysis of Gas Generated from Combustion or Heated Material	TN509
Particle Shape Characterization by Image Analysis	TN511
Measurement of Particle Size Distribution [Image Analysis]	TN510
Practical Use of Enantiomeric Chiral Stationary Phases which can Reverse the Elution Order of Enantiomers	TN259E
Characterization of Chiral Stationary Phases Chemically Bonded with β-Cyclodextrin via Improved Spacer	TN256E
Selection Method of Chiral Stationary Phases	TN507
Characterization of Polymers with Differential Scanning Calorimetry (DSC)	TN505
Structural Analysis with Small Angle X-ray Scattering	TN502
Measurement of Specific Surface Area and Pore Size Distribution by Nitrogen Adsorption Method	TN132
Molding and Evaluation of Physical Properties of Thermoplastic Resin	TN501
True Density Measurement with Gas Adsorption Measuring Device	TN498
High Sensitivity and Selectivity Determination of Cosmetic Ingredients by LC-MS/MS	TN500
Cross-Sectional SEM Observation of Rubber Containing Inorganic Particles Using Temperature Controlled Cryo-Ar Ion Milling Method	TN432
Separation and Structural Analysis of Organic Compounds	TN488
Determination of Inorganic Impurities in Graphite	TN027E
Determination of Ultratrace Impurities using Inductively Coupled Plasma Mass Spectrometry （ICP-MS）	TN051
Visualization of Components and Structure in the Micro Region: Imaging Analysis by Raman Microspectroscopy	TN485
Precision Measurement of Coefficient of Thermal Expansion (CTE) by High Sensitivity TMA	TN484
Determination of Trace Nitrogen by Oxidative Combustion and Chemiluminescence	TN482
Determination of Carbon and Sulfur Content in Solid and Powder Sample - Infrared Absorption Method after Combustion -	TN480
Determination of Metallic Elements by Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES)	TN023
Liquefied Petroleum Gas (LPG) Analysis	TN479
Techniques for Qualitative Analysis of Trace Level Unknown Compounds by LC-FTMS	TN478
Composition Analysis of Lubricating Oil	TN477
Evaluation technology for automotive fuel, oil and deposits	TN475
Evaluation of Acid Sites in Cu Ion Exchanged Zeolites	TN474
Evaluation of polymer materials by ESR method	TN463
Characterization of Catalysts by Temperature Programmed Reaction Method	TN461
Evaluation of Surface Modification of Solid Samples by X-ray Photoelectron Spectroscopy (XPS)	TN458
Crystal Structural Analysis by X-ray Diffraction in Controlled Atmosphere	TN457
Analysis of Differential adsorption heat using adsorption curve	TN456
Top Surface Observation of Fine Particles by High-resolution Low-voltage SEM	TN454
Crystalline Evaluation of Organic Semiconductors by TEM using Cryo-FIB Method	TN452
Evaluation of Thermal Reactivity by TG-DTA Measurement in Particular Gas	TN446
Identification of Surfactants	TN445
Risk assessment of Flammable Powder	TN444
Evaluation of Functional Groups on Polymeric Material Surface by X-ray Photoelectron Spectroscopy (XPS)	TN442
High Resolution SEM Observation of Surface and Inside of Pt Catalysts	TN434
High Resolution Mass Analysis with MALDI-SpiralTOF/MS	TN431
Evaluation of Adsorption / Desorption Properties of NO and SO3	TN427
Identification of Foreign Matter by Pyrolysis-GC/MS	TN426
Observation of the Coated Paper prepared using Cross Section by FE-SEM	TN419
Minimum Ignition Energy Measurement of Combustible Dusts by MIKE4	TN412
Dust Explosion Tests of High Pharmacological Active Substances	TN411
Wide Area Mapping of Glass Surface by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)	TN407
Qualitative Analysis of Fluorinated Surface Modifiers by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)	TN406
Qualitative Analysis of Watermarks by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)	TN405
Determination of Thermal Conductivity of Automotive Exhaust Catalysts	TN404
Determination of Perfluorinated Compounds (PFCs)－PFCAs、PFASs	TN399
Measurement of particle size distribution [Dry sieving]	TN379
Characterization of epoxy resin by pulsed NMR	TN378
Thermogravimetry - Mass Spectrometry	TN374
Evaluation of thermal stability by isoperibolic calorimeter "RADEX"	TN366
Determination of Hydrogen in Zinc Coated Steel Using Thermal Desorption Spectroscopy	TN358
Evaluation of moisture sorption property	TN344
Measurement Method of Volatile Organic Compounds (VOC) Diffused from Automotive Parts	TN342
Separated determination of chemical and physical adsorption by difference adsorption isotherm	TN338
Identification of foreign substances in drugs	TN329
Identification of foreign substances in drugs	TN328
Evaluation of the oxidative degradation for polymer materials by the measurement of chemiluminescence	TN324
Evaluation of the oxidative degradation for organic compounds by the measurement of chemiluminescence	TN323
Solid-state 30Si NMR characterization of silica	TN319
Measurement of cavity rate and filler content rate by X-RAY CT SYSTEM	TN318
Materials Evaluation by Use of the Electron Microscope with Cs-corrector	TN304
Enantiomer Separation of Pyrethroids by HPLC using SUMICHIRAL OA Series	TN268
Separation of Fluorous-tag Compounds using SUMICHIRAL OA-7001 Series	TN263
Performance and Use of SUMIPAX Filter	TN262
Practical Use of Enantiomeric Chiral Stationary Phases which can Invert Elution Order	TN259
Determination of D-amino Acids using Improved Pirkle-type Chiral Stationary Phases	TN257
Characterization of Chiral Stationary Phases Chemically Bonded with β-Cyclodextrin via Improved Spacer	TN256
Comparative Studies of Several Ligand Exchange Chiral Stationary Phases for HPLC ( Part 2 ： Aspartic Acid )	TN255
Chemical state analysis in micro area by EPMA	TN253
Evaluation of a surface characteristic by a steam absorption isothermal line	TN249
Carbon　analysis of a small quantity in the steel by EPMA	TN245
Water Vapor Permeability Test of packaging foils and films	TN243
Catalyst characterization using in-situ FT-IR spectroscopy	TN185
Electron Probe MicroAnalysis（EPMA）Scanning Electron Microscopy（SEM）	TN174
Electron Probe MicroAnalysis（EPMA）X-Ray Diffraction（XRD）	TN173
Field Desorption Mass Spectrometry（FD-MS）	TN169
Cross-Section Analysis of Multi-Paint Layers by TOF-SIMS	TN166
Measurement of particle size distribution [Laser diffraction/Optical scattering]	TN161
Cross section analysis of a silica particle by Time of Flight Secondary Ion Mass Spectrometry	TN153
The Additive Analysis of Clear Plastic Wrap Surface by TOF-SIMS	TN152
Analysis of fish-eye in PVC film by TOF-SIMS	TN151
Measurement of surface and interface tension by pendant drop method	TN142
Measurement of Contact Angle by Video Image Processing Method	TN141
Measurement of density by oscillational density meter	TN139
Evaluation of Metal Surface Area of Catalysts by Pulse Chemisorption	TN135
Numerical Evaluation for Powder Characteristics	TN134
Analysis of Macro-Molecular Materials Using Double Shot Pylolyzer	TN100
Structure Analysis of Polyurethane Type Adhesive	TN099
Analysis of Additives in Polymers	TN098
Determination of Trace Sulfur and Halogen in Organic Compounds	TN093
Structure Analysis of Dyes and Pigments	TN081
Composition Analysis of Printing Ink	TN069
Polymer Characterization and Additive Analysis	TN068
Analysis of Inorganic Impurities in Chemicals for Semiconductor Manufacturing	TN066
Glow Discharge Mass Spectrometry	TN061
Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)	TN060
Determination of impurities in fine ceramics	TN049
The Structure Analysis with Attenuated Total Reflection Method（ATR）of Fourier Transform Infrared Spectroscopy（FT-IR）	TN022
The Surface Structure Analysis with Reflection Method of Fourier Transform Infrared Spectroscopy（FT-IR）	TN020

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