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Elemental Analysis / Composition Analysis

We analyze purity of products and materials in manufacturing process, composition of impurity, exhaust gas and waste water in a wide range of industrial fields.

Absorption Spectrophotometer, Atomic Emission Spectrometer (AES), Atomic Absorption Spectrometer (AAS), Flame-AAS (FL-AAS), Inductively-Coupled Plasma Mass Spectrometer (ICP-MS), X-ray Fluorescence Spectrometer (XRF), Organic Elemental Analyzer, Glow Discharge Mass Spectrometer (GDMS), Particle Composition Analyzer, Automatic Trace Total Nitrogen Analyzer (TN), High-Sensitivity Carbon-Nitrogen Analyzer (NC)

Title No.
Determination of Inorganic Impurities in Graphite NEW TN027
Determination of 10 Substances Listed in Revised RoHS Directive NEW TN322
Determination of Ultratrace Impurities using Inductively Coupled Plasma Mass Spectrometry (ICP-MS) NEW TN051
Determination of Trace Nitrogen by Oxidative Combustion and Chemiluminescence TN482
Determination of Carbon and Sulfur Content in Solid and Powder Sample
- Infrared Absorption Method after Combustion -
Determination of Metallic Elements by Inductively Coupled Plasma Atomic Emission
Spectrometry (ICP-AES)
Liquefied Petroleum Gas (LPG) Analysis TN479
Determination of Elemental Impurities in Drugs, Compliant with ICHQ4D TN476
Analysis of Halogens and Sulfur (ppb levels) by Combustion Ion Chromatography TN470
Online Analysis of Generated Gases in Lithium-Ion Secondary Batteries TN469
Measurement of Absolute Quantity of Organic Compounds by quantitative NMR TN468
Evaluation of acidic and basic contaminants using solid active sampler BremS® TN438
Analysis of Gases Confined in Sealed Space TN425
Chemical Analysis of Trace Metal Contamination on φ450 mm Silicon Wafer Surface TN410
Measurement of nanomaterials in working environment TN386
Specification Test for Biologics (Test Items with assay platform) TN353
Determination of Metallic Impurities in Silicon Solar Cell TN348
Determination of Trace Impurities on Silicon Surface in Solar Cell TN347
Analysis of Metallic Impurities in Limited Area of Silicon Wafer TN335
Chemical Analysis of Metallic Impurities in Fused Silica Materials TN334
Wafer Edge and Bevel Area Analysis Using the Horizontal Substrate Inspection Device TN333
Analysis of the anode material for Li-ion batteries by ICP-AES and ICP-MS TN301
Outline of analysis methods for Li-ion batteries TN291
The section analysis of the LSI chip by FIB-AES TN287
Depth profiling of SUS by Auger Electron Spectroscopy TN286
Auger Electron Spectroscopy TN284
Determination of total phosphorus in clean room air TN200
Phosphorus Analysis of Oxide Film on Silicon Wafer Surface by High Resolution Inductively Coupled Plasma Mass Spectrometry(HR-ICP-MS) TN192
Chemical Analysis of Metallic Impurities in High Performance Thin Films on Silicon Wafer TN187
A High Performance C, H, N Analysis TN101
Analysis of Outgas Released from LSI Materials TN095
Determination of Trace Sulfur and Halogen in Organic Compounds TN093
Measurement of Trace Amount of Organic and Inorganic Components in Exhausted Gas from Scrubber TN092
Composition Analysis of Printing Ink TN069
Polymer Characterization and Additive Analysis TN068
Analysis of Inorganic Impurities in Chemicals for Semiconductor Manufacturing TN066
Analysis of Metallic Impurities in Purified Gases for Semiconductor Manufacturing TN065
Glow Discharge Mass Spectrometry TN061
Qualitative and quantitative analysis of gases evolved by combustion of plastics TN058
Determination of Inorganic Impurities in Highly Purified Quartz TN050
Determination of impurities in fine ceramics TN049
Evaluation Methods for Trace Impurities in Clean Room Air TN045
Chemical Analysis of Boro-Phospho Silicate and Phospho Silicate Glasses TN043
Chemical Analysis of Metallic Impurities on Silicon Wafer Surface TN042
Oxide Thickness Determination by X-ray Photoelectron Spectroscopy (XPS) TN033
Determination of C,H,N in Polyimide Film Coated on Silicon Wafer by CHN Analyzer TN032
Characterization of Fine Substance on Silicon Wafer with Fourier Transform Infrared Microspectrometry(m-FT-IR) TN028

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