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Elemental Analysis / Composition Analysis

We analyze purity of products and materials in manufacturing process, composition of impurity, exhaust gas and waste water in a wide range of industrial fields.

Absorption Spectrophotometer, Atomic Emission Spectrometer (AES), Atomic Absorption Spectrometer (AAS), Flame-AAS (FL-AAS), Inductively-Coupled Plasma Mass Spectrometer (ICP-MS), X-ray Fluorescence Spectrometer (XRF), Organic Elemental Analyzer, Glow Discharge Mass Spectrometer (GDMS), Particle Composition Analyzer, Automatic Trace Total Nitrogen Analyzer (TN), High-Sensitivity Carbon-Nitrogen Analyzer (NC)

Title No.
Ultra-trace Analysis of Metal Impurities in Non-silicon Thin Films on Silicon Wafers NEW TN187
Measurement of A Trace Amount of Organic and Inorganic Components in Exhaust Gases from Scrubbers NEW TN092
High Accuracy CHN Elemental Analysis NEW TN101
Introduction of Laser Induced Breakdown Spectroscopy (LIBS) TN517
Analysis of Elements in Biological Samples by ICP-MS/ICP-AES TN515
Living Environment Impact Assessment for Install of a Waste Treatment Facility TN508
Comprehensive Analysis of Fuel Components and Trace Analysis of Sulfur Compounds TN503
Chemical Analysis of Metallic Impurities in Fused Silica Materials TN334
Separation and Structural Analysis of Organic Compounds TN488
Determination of Inorganic Impurities in Graphite TN027E
Determination of Ultratrace Impurities using Inductively Coupled Plasma Mass Spectrometry (ICP-MS) TN051
Determination of Trace Nitrogen by Oxidative Combustion and Chemiluminescence TN482
Determination of Carbon and Sulfur Content in Solid and Powder Sample
- Infrared Absorption Method after Combustion -
Determination of Metallic Elements by Inductively Coupled Plasma Atomic Emission
Spectrometry (ICP-AES)
Liquefied Petroleum Gas (LPG) Analysis TN479
Determination of Elemental Impurities in Drugs, Compliant with ICHQ4D TN476
Evaluation of acidic and basic contaminants using solid active sampler BremS® TN438
Analysis of Gases Confined in Sealed Space TN425
Chemical Analysis of Trace Metal Contamination on φ450 mm Silicon Wafer Surface TN410
Specification Test for Biologics (Test Items with assay platform) TN353
Determination of Trace Impurities on Silicon Surface in Solar Cell TN347
Analysis of Metallic Impurities in Limited Area of Silicon Wafer TN335
Wafer Edge and Bevel Area Analysis Using the Horizontal Substrate Inspection Device TN333
Phosphorus Analysis of Oxide Film on Silicon Wafer Surface by High Resolution Inductively Coupled Plasma Mass Spectrometry(HR-ICP-MS) TN192
Determination of Trace Sulfur and Halogen in Organic Compounds TN093
Composition Analysis of Printing Ink TN069
Polymer Characterization and Additive Analysis TN068
Analysis of Inorganic Impurities in Chemicals for Semiconductor Manufacturing TN066
Glow Discharge Mass Spectrometry TN061
Determination of Inorganic Impurities in Highly Purified Quartz TN050
Determination of impurities in fine ceramics TN049
Evaluation Methods for Trace Impurities in Clean Room Air TN045
Chemical Analysis of Boro-Phospho Silicate and Phospho Silicate Glasses TN043
Chemical Analysis of Metallic Impurities on Silicon Wafer Surface TN042
Oxide Thickness Determination by X-ray Photoelectron Spectroscopy (XPS) TN033
Characterization of Fine Substance on Silicon Wafer with Fourier Transform Infrared Microspectrometry(m-FT-IR) TN028

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For inquiries and requests concerning services of analysis, measurements, products and consulting , please feel free to contact us via inquiry form or telephone/fax .