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Degradation / Damage / Foreign Substance

Title No.
Introduction of Laser Induced Breakdown Spectroscopy (LIBS) TN517
Comprehensive Thermophysical Analysis of Conductive Pastes TN516
Structural Analysis of Mixed Organic Compounds Using Kendrick Mass Defect Plot TN514
Gas Corrosion Test of In-Vehicle Electronic Equipment with S8 Gas TN513
Evaluation of Thermal Radiation Characteristics by Total Emissivity Measurement TN512
Particle Shape Characterization by Image Analysis TN511
Measurement of Particle Size Distribution [Image Analysis] TN510
Characterization of Polymers with Differential Scanning Calorimetry (DSC) TN505
Comprehensive Analysis of Fuel Components and Trace Analysis of Sulfur Compounds TN503
Separation and Structural Analysis of Organic Compounds TN488
Visualization of Components and Structure in the Micro Region: Imaging Analysis by Raman Microspectroscopy TN485
Precision Measurement of Coefficient of Thermal Expansion (CTE) by High Sensitivity TMA TN484
Techniques for Qualitative Analysis of Trace Level Unknown Compounds by LC-FTMS TN478
Composition Analysis of Lubricating Oil TN477
Evaluation of polymer materials by ESR method TN463
Degradation Analysis of Positive-electrode Active Material for Lithium-ion Batteries by TEM TN440
Identification of Foreign Matter by Pyrolysis-GC/MS TN426
UV-Py-GC/MS Evaluation of Deterioration in Polymers due to UV, Oxidation and Heat TN349
Evaluation of Degradation of Polymer Encapsulants in Photovoltaic Cell TN346
Identification of foreign substances in drugs TN329
Identification of foreign substances in drugs TN328
Evaluation of the oxidative degradation for polymer materials by the measurement of chemiluminescence TN324
Evaluation of the oxidative degradation for organic compounds by the measurement of chemiluminescence TN323
Analysis of Deterioration of Hydrocarbon Polymer Electrolyte Film TN311
Diagnosis for LCD Unevenness
-Determination of Foreign Particle Using Micromanipulator-
TN075
Depth Profile of SUS Pipe by X-ray Photoelectron Spectroscopy TN008
Analysis of Unknown Sample by X-ray Photoelectron Spectroscopy (XPS) TN002

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