1. HOME
  2. Technical Informations
  3. Technical News
  4. Surface Analysis

Surface Analysis

This group of application is to analyze surficial and interfacial state of electric materials, metals, ceramics, catalysts, and other substances. Also, it is useful to identify alien substances contained in the surface or interface of substances.

Secondary Ion Mass Spectrometer (SIMS), Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS), X-Ray Photoelectron Spectrometer (XPS or ESCA), Scanning Auger Electron Spectroscopy (AES  or SAM), Electron Probe Micro Analyzer (EPMA or XMA), Field Emission Scanning Electron Microscope X-Ray Spectroscopy (FE-SEM-EDX), Thermal Desorption Gas Chromatograph-Mass Spectrometer (TDS), Low Arpha-Ray Spectrometer, etc.

Title No.
Visualization of Components and Structure in the Micro Region: Imaging Analysis by Raman Microspectroscopy TN485
Evaluation of Surface Modification of Solid Samples by X-ray Photoelectron Spectroscopy (XPS) TN458
Shape Evaluation of Human Hair Cuticle by Atomic Force Microscope (AFM) TN453
Evaluation of Functional Groups on Polymeric Material Surface by X-ray Photoelectron Spectroscopy (XPS) TN442
Observation of the Binder Resin in Cathode Material for Li-ion batteries by EPMA TN418
Parallel Angle Resolved X-ray Photoelectron Spectroscopy (PAR-XPS) TN414
Evaluation of Thin Film by Parallel Angle Resolved X-ray Photoelectron Spectroscopy TN413
Evaluation of Contamination from Outgassing by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN408
Wide Area Mapping of Glass Surface by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN407
Qualitative Analysis of Fluorinated Surface Modifiers by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN406
Qualitative Analysis of Watermarks by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN405
Inner observation and chemical mapping of tablet by X-ray CT and TOF-SIMS TN369
Three-dimensional analysis by TOF-SIMS TN339
Identification of foreign substances in drugs TN329
Identification of foreign substances in drugs TN328
Observation of the cross section of MEA for fuel cells by FE-EPMA TN310
Outline of analysis methods for fuel cells TN308
Observation of the cross section of electrodes for Li-ion batteries by FE-EPMA TN294
Outline of analysis methods for Li-ion batteries TN291
TOF-SIMS Analysis Using Five-Axis Stage TN289
Wide Area Mapping by Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN288
Chemical state analysis in micro area by EPMA TN253
Analysis of metal micro structure TN248
Carbon analysis of a small quantity in the steel by EPMA TN245
Introduction of Quadrupole SIMS TN183
Electron Probe MicroAnalysis(EPMA)Scanning Electron Microscopy(SEM) TN174
Electron Probe MicroAnalysis(EPMA)X-Ray Diffraction(XRD) TN173
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Analysis of Rinsed Hair TN168
Cross-Section Analysis of Multi-Paint Layers by TOF-SIMS TN166
Surface analysis of wafers after post Cu-CMP cleaning by Time of Flight Secondary Ion Mass Spectrometry(TOF-SIMS) TN165
Cross section analysis of a silica particle by Time of Flight Secondary Ion Mass Spectrometry TN153
The Additive Analysis of Clear Plastic Wrap Surface by TOF-SIMS TN152
Analysis of fish-eye in PVC film by TOF-SIMS TN151
Surface analysis of wafer after post Cu-CMP cleaning by X-ray Photoelectron
Spectroscopy(XPS)
TN148
Structure Analysis of Dyes and Pigments TN081
Diagnosis for LCD Unevenness
-Determination of Foreign Particle Using Micromanipulator-
TN075
Study of inferiority of liquid crystal displays
-Analysis of polyimide alignment film by XPS-
TN073
Study of Inferiority of Liquid Crystal Displays
-Analysis of Polyimide Alignment Film by TOF-SIMS-
TN072
Composition Analysis of Printing Ink TN069
Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN060
Introduction of Atomic Force Microscope (AFM) TN053
Characterization of Fine Substance on Silicon Wafer with Fourier Transform Infrared Microspectrometry(m-FT-IR) TN028
Depth Profile of SUS Pipe by X-ray Photoelectron Spectroscopy TN008
Analysis of Unknown Sample by X-ray Photoelectron Spectroscopy (XPS) TN002

Contact Us for Services

For inquiries and requests concerning services of analysis, measurements, products and consulting , please feel free to contact us via inquiry form or telephone/fax .

Telephone
+81-3-5689-1219
FAX
+81-3-5689-1222