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Structural Analysis

The applications in this goup are useful for determing structure of new chemical substances, materials, impurities, and reaction products generated from every field of industry as well as metabolites in pharmaceutical field.

Nuclear Magnetic Resonance Spectrometer (NMR), Organic Mass Spectrometer (MS), Time-of-Flight Mass Spectrometer (TOF-MS), Ultraviolet-Visible Spectrophotometer (UV-VIS), Fourier Transform Infrared Spectrometer (FT-IR)、Fourier Transform Infrared Microscope (μ-FT-IR), Scanning Infrared Microprobe System (IRμS/SIRM), Laser Raman Scattering Spectrometer (RSS), Electron Spin Resonance Spectrometer (ESR), X-Ray Diffractometer (XRD), X-ray Absorption Fine Structure Analyzer (XAFS), etc.

Title No.
XAFS Measurement of Molten Glass Using the Heating Cell TN495
Estimation of Molecular Orientation in Organic Thin Films by XAS TN492
In situ XRD for Lithium Ion Batteries with Controlling Temperature TN491
Structural Analysis of Mixed Organic Compounds Using Kendrick Mass Defect Plot TN514
Structure analysis of liquid crystal compounds TN070
Structural Analysis with Small Angle X-ray Scattering TN502
Comprehensive Analysis of Fuel Components and Trace Analysis of Sulfur Compounds TN503
Cross-Sectional SEM Observation of Rubber Containing Inorganic Particles Using Temperature Controlled Cryo-Ar Ion Milling Method TN432
Separation and Structural Analysis of Organic Compounds TN488
Visualization of Components and Structure in the Micro Region: Imaging Analysis by Raman Microspectroscopy TN485
Techniques for Qualitative Analysis of Trace Level Unknown Compounds by LC-FTMS TN478
Composition Analysis of Lubricating Oil TN477
Evaluation technology for automotive fuel, oil and deposits TN475
Crystal Structural Analysis by X-ray Diffraction in Controlled Atmosphere TN457
Identification of Surfactants TN445
High Resolution Mass Analysis with MALDI-SpiralTOF/MS TN431
Electron Microscope Observations of Bulk-Hetero Junction Organic Solar Cells TN403
Inner observation and chemical mapping of tablet by X-ray CT and TOF-SIMS TN369
Specification Tests for Biologics using Amino Acid Analysis TN365
Evaluation of Degradation of Polymer Encapsulants in Photovoltaic Cell TN346
Identification of foreign substances in drugs TN329
Solid-state 30Si NMR characterization of silica TN319
Measurement of cavity rate and filler content rate by X-RAY CT SYSTEM TN318
Analysis of Deterioration of Hydrocarbon Polymer Electrolyte Film TN311
Cristallization analysis of the cathode material for Li-ion batteries by XRD TN295
Nondestructive observation of Li-ion batteries by X-ray CT TN292
Catalyst characterization using in-situ FT-IR spectroscopy TN185
Electron Probe MicroAnalysis(EPMA)Scanning Electron Microscopy(SEM) TN174
Electron Probe MicroAnalysis(EPMA)X-Ray Diffraction(XRD) TN173
Field Desorption Mass Spectrometry(FD-MS) TN169
Analysis of fish-eye in PVC film by TOF-SIMS TN151
Analysis of Macro-Molecular Materials Using Double Shot Pylolyzer TN100
Structure Analysis of Polyurethane Type Adhesive TN099
Analysis of Additives in Polymers TN098
Characterization of Polymorphism TN097
Structure Determination of Medicine(Regioisomers) TN090
Structure Analysis of Dyes and Pigments TN081
Diagnosis for LCD Unevenness
-Determination of Foreign Particle Using Micromanipulator-
Composition Analysis of Printing Ink TN069
Polymer Characterization and Additive Analysis TN068
Fourier Transform NMR Method -Two Dimensional NMR- TN057
Oxide Thickness Determination by X-ray Photoelectron Spectroscopy (XPS) TN033
The Structure Analysis with Attenuated Total Reflection Method(ATR)of Fourier Transform Infrared Spectroscopy(FT-IR) TN022
The Surface Structure Analysis with Reflection Method of Fourier Transform Infrared Spectroscopy(FT-IR) TN020
Structure Determination of Natural Compound TN017

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