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  4. Morphological Observation

Morphological Observation

Surficial and interfacial morphology of substances from various industrial fields can be observed directly through electron microscopes. Inside of substances can be also observed directly.

Optical Microscope (OM), Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM)、Field Emission Scanning Electron Microscope (FE-SEM), Scanning Probe Microscope (SPM), Atomic Force Microscope (AFM)、Focused Ion Beam System (FIB), etc.

Title No.
Observation of Tissue Structure in Frozen Samples by Synchrotron Radiation X-ray CT TN496
Visualization of Electrode Slurry Drying Process using 4D Laminography TN494
Analysis of Three-dimensional Porous Network Structure and Making Transparent Layer Models of Li-ion Battery Electrode TN493
Top Surface Observation of Fine Particles by High-resolution Low-voltage SEM TN454
Crystalline Evaluation of Organic Semiconductors by TEM using Cryo-FIB Method TN452
Degradation Analysis of Positive-electrode Active Material for Lithium-ion Batteries by TEM TN440
High Resolution SEM Observation of Surface and Inside of Pt Catalysts TN434
Pore Structure Evaluation of Separator for Lithium-ion Batteries TN433
Analysis of Li Dendrite Deposition Process toward Safety Improvement of Li-ion Batteries TN424
Direct Observation of Lithium Ion Diffusion in Electrode for Li-ion Batteries TN423
Real-Time Observation of Chromatic Transition of Li-ion Battery Electrode Induced by Charge/Discharge Reaction TN422
Observation of the Coated Paper prepared using Cross Section by FE-SEM TN419
Evaluation of Layered Structure of Organic Semiconductors by Electron Microscope TN409
Evaluation of thin film silicon solar cell TN345
Identification of foreign substances in drugs TN328
Observation of the cross section of MEA for fuel cells by X-ray CT TN309
Materials Evaluation by Use of the Electron Microscope with Cs-corrector TN304
Observation of the cross section of electrodes for Li-ion batteries by FE-SEM TN293

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