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Electronic Materials / Devices / Equipments

Title No.
Ultra-trace Analysis of Metal Impurities in Non-silicon Thin Films on Silicon Wafers NEW TN187
Analysis of Outgas Emitted from Electronic Device Components and Materials TN095
Thermal Conductivity Measurements for Thermal Management — Laser Flash Method — TN522
Introduction of Laser Induced Breakdown Spectroscopy (LIBS) TN517
Comprehensive Thermophysical Analysis of Conductive Pastes TN516
Structural Analysis of Mixed Organic Compounds Using Kendrick Mass Defect Plot TN514
Thermal Shock Test TN317
Gas Corrosion Test of In-Vehicle Electronic Equipment with S8 Gas TN513
Evaluation of Thermal Radiation Characteristics by Total Emissivity Measurement TN512
Particle Shape Characterization by Image Analysis TN511
Measurement of Particle Size Distribution [Image Analysis] TN510
Characterization of Polymers with Differential Scanning Calorimetry (DSC) TN505
Structure analysis of liquid crystal compounds TN070
Chemical Analysis of Ionic Contaminants on Silicon Wafer Surface TN176
True Density Measurement with Gas Adsorption Measuring Device TN498
Chemical Analysis of Metallic Impurities in Fused Silica Materials TN334
Cross-Sectional SEM Observation of Rubber Containing Inorganic Particles Using Temperature Controlled Cryo-Ar Ion Milling Method TN432
Separation and Structural Analysis of Organic Compounds TN488
Determination of Inorganic Impurities in Graphite TN027E
Determination of Ultratrace Impurities using Inductively Coupled Plasma Mass Spectrometry (ICP-MS) TN051
Visualization of Components and Structure in the Micro Region: Imaging Analysis by Raman Microspectroscopy TN485
Precision Measurement of Coefficient of Thermal Expansion (CTE) by High Sensitivity TMA TN484
Crystalline Evaluation of Organic Semiconductors by TEM using Cryo-FIB Method TN452
Ultratrace thermal desorption gas analysis by Atmospheric Pressure Ionization-Mass Spectrometry (API-MS) TN448
Degradation Analysis of Positive-electrode Active Material for Lithium-ion Batteries by TEM TN440
Pore Structure Evaluation of Separator for Lithium-ion Batteries TN433
Analysis of Gases Confined in Sealed Space TN425
Analysis of Li Dendrite Deposition Process toward Safety Improvement of Li-ion Batteries TN424
Direct Observation of Lithium Ion Diffusion in Electrode for Li-ion Batteries TN423
Real-Time Observation of Chromatic Transition of Li-ion Battery Electrode Induced by Charge/Discharge Reaction TN422
Observation of the Binder Resin in Cathode Material for Li-ion batteries by EPMA TN418
Chemical Analysis of Trace Metal Contamination on φ450 mm Silicon Wafer Surface TN410
Evaluation of Layered Structure of Organic Semiconductors by Electron Microscope TN409
Electron Microscope Observations of Bulk-Hetero Junction Organic Solar Cells TN403
Determination of thermal conductivity of heat radiation materials TN373
UV-Py-GC/MS Evaluation of Deterioration in Polymers due to UV, Oxidation and Heat TN349
Determination of Trace Impurities on Silicon Surface in Solar Cell TN347
Evaluation of Degradation of Polymer Encapsulants in Photovoltaic Cell TN346
Evaluation of thin film silicon solar cell TN345
Three-dimensional analysis by TOF-SIMS TN339
Analysis of Metallic Impurities in Limited Area of Silicon Wafer TN335
Wafer Edge and Bevel Area Analysis Using the Horizontal Substrate Inspection Device TN333
Structural analysis of liquid crystal compounds using gas chromatography/time of flight mass spectrometry TN331
Analysis of Deterioration of Hydrocarbon Polymer Electrolyte Film TN311
Observation of the cross section of MEA for fuel cells by FE-EPMA TN310
Observation of the cross section of MEA for fuel cells by X-ray CT TN309
Materials Evaluation by Use of the Electron Microscope with Cs-corrector TN304
Cristallization analysis of the cathode material for Li-ion batteries by XRD TN295
Observation of the cross section of electrodes for Li-ion batteries by FE-EPMA TN294
Observation of the cross section of electrodes for Li-ion batteries by FE-SEM TN293
Nondestructive observation of Li-ion batteries by X-ray CT TN292
TOF-SIMS Analysis Using Five-Axis Stage TN289
Wide Area Mapping by Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN288
Chemical state analysis in micro area by EPMA TN253
Phosphorus Analysis of Oxide Film on Silicon Wafer Surface by High Resolution Inductively Coupled Plasma Mass Spectrometry(HR-ICP-MS) TN192
Sticking Behavior of Acidic and Basic Compounds onto Silicon Wafer Surface TN177
Surface analysis of wafers after post Cu-CMP cleaning by Time of Flight Secondary Ion Mass Spectrometry(TOF-SIMS) TN165
Surface analysis of wafer after post Cu-CMP cleaning by X-ray Photoelectron
Diagnosis for LCD Unevenness
-Determination of Foreign Particle Using Micromanipulator-
Glow Discharge Mass Spectrometry TN061
Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN060
Determination of Inorganic Impurities in Highly Purified Quartz TN050
Chemical Analysis of Boro-Phospho Silicate and Phospho Silicate Glasses TN043
Chemical Analysis of Metallic Impurities on Silicon Wafer Surface TN042
Oxide Thickness Determination by X-ray Photoelectron Spectroscopy (XPS) TN033
Characterization of Fine Substance on Silicon Wafer with Fourier Transform Infrared Microspectrometry(m-FT-IR) TN028

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