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Electronic Materials / Devices / Equipments

Title No.
Determination of Inorganic Impurities in Graphite NEW TN027
Determination of 10 Substances Listed in Revised RoHS Directive NEW TN322
High Sensitivity Alpha Ray Measurement for Solid Materials NEW TN026
Determination of Ultratrace Impurities using Inductively Coupled Plasma Mass Spectrometry (ICP-MS) NEW TN051
Visualization of Components and Structure in the Micro Region: Imaging Analysis by Raman Microspectroscopy TN485
Precision Measurement of Coefficient of Thermal Expansion (CTE) by High Sensitivity TMA TN484
Evaluation of Conductive Network in the Electrode of Li-ion Battery by SPM TN472
Analysis of Halogens and Sulfur (ppb levels) by Combustion Ion Chromatography TN470
Online Analysis of Generated Gases in Lithium-Ion Secondary Batteries TN469
Structural Analysis of Woody Biomass TN459
Crystalline Evaluation of Organic Semiconductors by TEM using Cryo-FIB Method TN452
Ultratrace thermal desorption gas analysis by Atmospheric Pressure Ionization-Mass Spectrometry (API-MS) TN448
Spatial Distribution of Electrolyte Derivatives in a Positive-electrode for Lithium-ion Batteries Using STEM-EELS TN441
Degradation Analysis of Positive-electrode Active Material for Lithium-ion Batteries by TEM TN440
Impurity Analysis of Compressed Air TN437
Pore Structure Evaluation of Separator for Lithium-ion Batteries TN433
Cross-sectional SEM Observation of Separator Using Cryo-Ar Ion Milling Technique TN432
Analysis of Gases Confined in Sealed Space TN425
Analysis of Li Dendrite Deposition Process toward Safety Improvement of Li-ion Batteries TN424
Direct Observation of Lithium Ion Diffusion in Electrode for Li-ion Batteries TN423
Real-Time Observation of Chromatic Transition of Li-ion Battery Electrode Induced by Charge/Discharge Reaction TN422
Observation of the Binder Resin in Cathode Material for Li-ion batteries by EPMA TN418
Measurement of Water Vapor Transmission Rate by Difference Pressure Method TN417
Parallel Angle Resolved X-ray Photoelectron Spectroscopy (PAR-XPS) TN414
Evaluation of Thin Film by Parallel Angle Resolved X-ray Photoelectron Spectroscopy TN413
Chemical Analysis of Trace Metal Contamination on φ450 mm Silicon Wafer Surface TN410
Evaluation of Layered Structure of Organic Semiconductors by Electron Microscope TN409
Electron Microscope Observations of Bulk-Hetero Junction Organic Solar Cells TN403
Determination of thermal conductivity of heat radiation materials TN373
UV-Py-GC/MS Evaluation of Deterioration in Polymers due to UV, Oxidation and Heat TN349
Determination of Metallic Impurities in Silicon Solar Cell TN348
Determination of Trace Impurities on Silicon Surface in Solar Cell TN347
Evaluation of Degradation of Polymer Encapsulants in Photovoltaic Cell TN346
Evaluation of thin film silicon solar cell TN345
Three-dimensional analysis by TOF-SIMS TN339
Analysis of Metallic Impurities in Limited Area of Silicon Wafer TN335
Chemical Analysis of Metallic Impurities in Fused Silica Materials TN334
Wafer Edge and Bevel Area Analysis Using the Horizontal Substrate Inspection Device TN333
Structural analysis of liquid crystal compounds using gas chromatography/time of flight mass spectrometry TN331
Method for measuring shear strength of solder joints on surface mount device TN330
Thermal Shock Test TN317
Analysis of Deterioration of Hydrocarbon Polymer Electrolyte Film TN311
Observation of the cross section of MEA for fuel cells by FE-EPMA TN310
Observation of the cross section of MEA for fuel cells by X-ray CT TN309
Outline of analysis methods for fuel cells TN308
High Resolution Observation by Use of the Electron Microscope with Cs-corrector TN306
Materials Evaluation by Use of the Electron Microscope with Cs-corrector TN304
Analysis of the anode material for Li-ion batteries by ICP-AES and ICP-MS TN301
Cristallization analysis of the cathode material for Li-ion batteries by XRD TN295
Observation of the cross section of electrodes for Li-ion batteries by FE-EPMA TN294
Observation of the cross section of electrodes for Li-ion batteries by FE-SEM TN293
Nondestructive observation of Li-ion batteries by X-ray CT TN292
Outline of analysis methods for Li-ion batteries TN291
TOF-SIMS Analysis Using Five-Axis Stage TN289
Wide Area Mapping by Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN288
The section analysis of the LSI chip by FIB-AES TN287
Auger Electron Spectroscopy TN284
Chemical state analysis in micro area by EPMA TN253
Phosphorus Analysis of Oxide Film on Silicon Wafer Surface by High Resolution Inductively Coupled Plasma Mass Spectrometry(HR-ICP-MS) TN192
Analysis and Evaluation of Contamination of Hard Disk Drive Materials and Components TN188
Chemical Analysis of Metallic Impurities in High Performance Thin Films on Silicon Wafer TN187
Introduction of Quadrupole SIMS TN183
Sticking Behavior of Acidic and Basic Compounds onto Silicon Wafer Surface TN177
Chemical Analysis of Ionic Contaminants on Silicon Wafer Surface TN176
Surface analysis of wafers after post Cu-CMP cleaning by Time of Flight Secondary Ion Mass Spectrometry(TOF-SIMS) TN165
Surface analysis of wafer after post Cu-CMP cleaning by X-ray Photoelectron
Spectroscopy(XPS)
TN148
Analysis of Outgas Released from LSI Materials TN095
Characterization of VLSI Materials Using Thermal Desorption Spectroscopy (TDS) TN094
Diagnosis for LCD Unevenness
-Determination of Foreign Particle Using Micromanipulator-
TN075
Study of inferiority of liquid crystal displays
-Analysis of polyimide alignment film by XPS-
TN073
Study of Inferiority of Liquid Crystal Displays
-Analysis of Polyimide Alignment Film by TOF-SIMS-
TN072
Structure analysis of liquid crystal compounds TN070
Glow Discharge Mass Spectrometry TN061
Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TN060
Introduction of Atomic Force Microscope (AFM) TN053
Determination of Inorganic Impurities in Highly Purified Quartz TN050
Chemical Analysis of Boro-Phospho Silicate and Phospho Silicate Glasses TN043
Chemical Analysis of Metallic Impurities on Silicon Wafer Surface TN042
Oxide Thickness Determination by X-ray Photoelectron Spectroscopy (XPS) TN033
Determination of C,H,N in Polyimide Film Coated on Silicon Wafer by CHN Analyzer TN032
Characterization of Fine Substance on Silicon Wafer with Fourier Transform Infrared Microspectrometry(m-FT-IR) TN028

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