 |
| Features of our Reliability Tests |
|
Electronic components
are subjected to environmental tests under the influence of inorganic gases, organic
gases and humidity that may cause chemical changes to the components, and the
performance and reliability of the components are evaluated using advanced analytical
techniques and electronic measuring techniques.
When any problem is found, we analyze the cause of the problem combining techniques
of nondestructive inspection, surface analysis, observation of sections, degassing
analysis and atmospheric measurement. |
Please contact us without
hesitation. We will conduct the tests according to the following flow and submit
the report to you.
|
| Outline of Major Environmental Tests and Failure
Analysis Items |
|
1. Environmental Tests
The environmental tests are conducted by exposing the samples to inorganic gases,
organic gases and humidity that may cause chemical changes to electronic components,
and the performance and reliability of the electronic components are evaluated
using our advanced analytical techniques and electronic measuring techniques.
2. Gas Corrosion Tests
We have gas test chambers applicable to various dimensions.
The chambers are applicable to various gases (sulfur dioxide, chlorine gas, hydrogen
sulfide gas, carbon dioxide, ammonia, etc.), gas concentrations, standards and
any desired testing conditions.
Combining with an insulation evaluation system enables to check the ion migration.
(Also joint reliability can be evaluated.)
3. Special Environmental Tests
We can accept requests for immersion tests of electronic components and plastics
in hazardous liquids, such as gasoline and engine oil, at high temperatures and
pressures and tests in hydrogen gas atmosphere.
We are ready for other environmental tests under various conditions (high-temperature
and high-humidity test, heat shock test, vibration test, impact test, light-resistance
test, weather-ability test, salt spray test, water-resistance test, dust resistance
test, etc.). |
<Environmental Tests>
| No. |
Test Item |
Testing Apparatus |
| 1. |
Heat-generated gas analysis
|
Heat-generated gas analyzer |
| 2. |
Organic gas test |
Organic gas exposure apparatus |
| 3. |
Corrosive gas test |
Corrosive gas tester |
| 4. |
Heat resistance test |
High-temperature and constant-humidity
chamber |
| 5. |
Low-temperature test |
Constant-temperature and humidity
chamber |
| 6. |
High-temperature and humidity
test |
Constant-temperature and humidity
chamber |
| 7. |
Condensation test |
Condensation tester |
| 8. |
Temperature cycle test |
Constant-temperature and humidity
chamber |
| 9. |
Heat shock test |
Heat shock tester |
| 10. |
Pressure cooker test (saturation/unsaturation)
|
Highly accelerated life tester |
| 11. |
Water resistance test |
Water resistance tester |
| 12. |
Hot oil test |
Hot oil tester |
| 13. |
Salt spray test |
Salt spray tester |
| 14. |
Solar radiation exposure test |
Sunshine weathermeter |
|
<Failure Analysis>
When any problem is found, we analyze the cause of the problem combining techniques
of nondestructive inspection, surface analysis, observation of sections, degassing
analysis and atmospheric measurement |
| No. |
Test Item |
Testing Apparatus |
| 1. |
X-ray
transmission and CT observation |
X-ray
transmission and CT apparatus |
| 2. |
Emission
microscope observation |
EMS |
| 3. |
Ultrasonic
microscope observation |
Ultrasonic
microscope |
| 4. |
Temperature
unevenness observation |
Phase-contrast
microscope |
| 5. |
Observation
of heat generating parts |
IR microscope |
| 6. |
Transistor
and diode characteristics |
Semiconductor
curve tracer |
| 7. |
Observation
of microstructures |
TEM-EDX
SEM |
| 8. |
Time-of-flight
secondary ion mass spectrometry |
TOF-SIMS |
| 9. |
X-ray
diffraction |
XED |
| 10. |
Fourier
transform infrared spectroscopy |
FT-IR |
| 11. |
Secondary
ion mass spectrometry |
SIMS |
| 12. |
X-ray photoelectron spectroscopy |
XPS |
| 13. |
Auger electron spectroscopy |
AES |
| 14. |
Atomic force microscopy |
AFM |
| 15. |
Surface roughness and hardness
measurement |
Roughness meter and hardness
meter |
|
| No. |
Test Item |
Testing Apparatus |
| 1. |
Random
vibration test |
Random
vibration tester |
| 2. |
Sine
wave vibration test |
Sine
wave vibration tester |
| 3. |
Impact
test |
Impact
tester |
| 4. |
Drop
impact test |
Drop
impact tester |
|
| No. |
Test Item |
Testing Apparatus |
| 1. |
Solderability
test |
Solderability
tester |
| 2. |
Dielectric
strength and insulation test |
Automatic
dielectric strength and insulation tester |
| 3. |
LCR/dielectric
constant measurement |
LCR
meter |
| 4. |
Insulation
resistance measurement |
Insulation
resistance tester |
| 5. |
Conduction
resistance measurement |
Milliohm
meter |
| 6. |
Multi-point
joint reliability evaluation |
Joint
reliability evaluation system |
| 7. |
Multi-point
ion migration evaluation |
Ion migration
evaluation system |
| 8. |
Semiconductor
parameter measurement |
Semiconductor
parameter analyzer |
| 9. |
Measurement
of quantity of light |
Light
power meter |
|
| In addition to the above systems, we have many
systems related to electronics fields. Please feel free to inquire. |
|
Precautions for Using the Website 
Contact Us
We contribute
toward securing the reliability of electronic components and precision components
by our analytical techniques.
