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AFM: Atomic Force Microscope   Principle of measurement   Major analytical applications for semiconductor materials A probe is fitted to the tip of the cantilever. The sample surface is scanned by this probe, and the cantilever gives an amplitude indicating the surface structure with the atomic force generated between the surface and the probe. The amplitude is detected with the aid of laser and graphically displayed. AFM image of wiring pattern AFM image of transparent conductive thin film

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